Faculty Information - Satoh Nobuo

Measurement engineering, Power engineering, Electric and electronic materials, Inorganic materials and properties, Thin film/surface and interfacial physical properties

■ E-Mail Address

■ Research activities

1.	2012/04～	IEEE
2.	2014/01～	The Surface Science Society of Japan

■ Works

1.	Book	Electricity and Magnetism for Beginners: Understanding Circuit Elements (Single) 2025/11/06
2.	Article	Development of an Isolated Class-Φ²₂ DC-DC Converter with Bidirectional Operation IEEJ Journal of Industry Applications 14(4),pp.529-534 (Collaboration) 2025/07/01
3.	Article	Harmonic balance analysis of tip-sample interaction and coexisting solutions in dynamic atomic force microscopy Nonlinear Theory and Its Applications, IEICE 16(3),pp.737-750 (Collaboration) 2025/07/01
4.	Article	Oxidation of Iodine using Ozone by Plasma Emitted in Aqueous Solution pp.392-398 (Collaboration) 2024/10/01
5.	Article	A Nondestructive Method to Evaluate of DC-DC Converters Using Subsurface Magnetic Field Imaging with Pulse Width Modulation IEEJ Journal of Industry Applications 13(3),pp.301-307 (Collaboration) 2024/05/01
6.	Article	Imaging of Magnetic Field Gradient around a Current Path by Alternating Magnetic Force Microscopy IEEJ Transactions on Sensors and Micromachines pp.62-67 (Collaboration) 2024/04/01
7.	Article	Development and Evaluation of Isolated Class-Φ_2n DC-DC Converter IEEJ Transactions on Industry Applications pp.149-155 (Collaboration) 2024/03/01
8.	Article	Power Distribution Technology based on Transmission of Power Packets via Conducting Metal Body IEEJ Transactions on Industry Applications pp.16-22 (Collaboration) 2024/01/01
9.	Article	Visualization of Current Paths by High-Frequency Magnetic Fields Using the Down-Conversion Method IEEJ Transactions on Industry Applications pp.236-241 (Collaboration) 2023/03/01
10.	Article	Evaluation of Internal Structure of GaN High Electron Mobility Transistor IEEJ Transactions on Sensors and Micromachines pp.316-324 (Collaboration) 2022/12/01
11.	Article	Design of Isolated Class-Φ₂ DC-DC Converter Based on Harmonic Analysis Technology IEEJ Transactions on Industry Applications pp.177-186 (Collaboration) 2022/04/01
12.	Article	Observation of Power MOSFET Composed of Silicon Carbide with a Planar Type in the Voltage Applying State Using a Scanning Probe Microscope IEEJ Transactions on Sensors and Micromachines pp.349-355 (Collaboration) 2021/10/01
13.	Article	Photo radiation pressure at resonance of frequency modulated micro cantilever Nonlinear Theory and Its Applications, IEICE 12(4),pp.718-725 (Collaboration) 2021/10/01
14.	Article	Visualizing Technique of Current Density for High-Frequency-Switching Power Converters The Journal of The Institute of Electrical Engineers of Japan pp.639-641 (Single) 2021/10/01
15.	Article	Evaluation of silicon carbide Schottky barrier diode within guard ring by multifunctional scanning probe microscopy Japanese Journal of Applied Physics 59,pp.SN1014 (Collaboration) 2020/06/15
16.	Article	Development of scanning capacitance force microscopy using the dissipative force modulation method 31,pp.035904 (Collaboration) 2019/12/27
17.	Article	Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices AIP Advances 9(11),pp.115011-1-115011-8 (Collaboration) 2019/11/14
18.	Article	Cross-sectional observation in nanoscale for Si power MOSFET by atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy Japanese Journal of Applied Physics 58 (Collaboration) 2019/06/13
19.	Article	Nanoscale investigation of bulk heterojunction organic solar cell by scanning capacitance force microscopy Japanese Journal of Applied Physics 57 (Collaboration) 2018/07/11
20.	Article	Driven by complementary operation of SiC-MOSFET and SiC-JFET within isolated flyback converter circuit Nonlinear Theory and Its Applications, IEICE 9(3),pp.337-343 (Collaboration) 2018/07/01
21.	Article	Imaging of an n- layer in a silicon fast recovery diode under applied bias voltages using Kelvin probe force microscopy Japanese Journal of Applied Physics Volume 57(Number 8S1) (Collaboration) 2018/07
22.	Article	Investigation of an n-layer in a silicon fast recovery diode under applied bias voltages using Kelvin probe force microscopy Japanese Journal of Applied Physics, Volume 57(Number 8S1) (Collaboration) 2018/07
23.	Article	Nanoscale investigation of bulk heterojunction organic solar cell by scanning capacitance force microscopy Japanese Journal of Applied Physics Volume 57(Number 8S1) (Collaboration) 2018/07
24.	Article	Nanoscale investigation of the silicon carbide double-diffused MOSFET with scanning capacitance force microscopy Japanese Journal of Applied Physics Volume 57(Number 8S1) (Collaboration) 2018/07
25.	Article	Evaluation of carrier concentration reduction in GaN-on-GaN wafers by Raman spectroscopy and Kelvin force microscopy Japanese Journal of Applied Physics Volume 56(Number 8S1) (Collaboration) 2017/07
26.	Article	Nanoscale observation of organic thin film by atomic force microscopy Japanese Journal of Applied Physics Volume 56(Number 8S1) (Collaboration) 2017/07
27.	Article	Near-field light detection of a photo induced force by atomic force microscopy with frequency modulation Japanese Journal of Applied Physics Volume 56(Number 8S1) (Collaboration) 2017/07
28.	Article	Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy Japanese Journal of Applied Physics Volume 56(Number 8S1) (Collaboration) 2017/07
29.	Article	Surface potential measurement of n-type organic semiconductor thin films by mist deposition via Kelvin probe microscopy Japanese Journal of Applied Physics Volume 56(Number 8S1) (Collaboration) 2017/07
30.	Article	Using dynamic force microscopy with piezoelectric cantilever for indentation and high-speed observation IEICE NONLINEAR THEORY AND ITS APPLICATIONS 8(2),pp.98-106 (Collaboration) 2017/04/26
31.	Article	Non-resonant frequency components observed in a dynamic Atomic Force Microscope IEICE Nonlinear Theory and Its Applications 8(2),pp.118-128 (Collaboration) 2017/04
32.	Article	Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy Japanese Journal of Applied Physics 55(8),pp.08NB10 (Collaboration) 2016/07
33.	Article	Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever Japanese Journal of Applied Physics Volume 55(Number 8S1) (Collaboration) 2016/07
34.	Article	Surface Potential and Topography Measurements of Gallium Nitride on Sapphire by Scanning Probe Microscopy IEEJ Transactions on Sensors and Micromachines pp.96-101 (Collaboration) 2016/04/01
35.	Article	Development of Multi-Probe Atomic Force Microscope and Probe Interaction IEICE Proceeding Series (47),pp.752-755 (Single) 2015/12/03
36.	Article	Surface potential measurement of fullerene derivative/copper phthalocyanine on indium tin oxide electrode by Kelvin probe force microscopy Japanese Journal of Applied Physics 54(8S1),pp.08KF06 (Collaboration) 2015/08
37.	Article	Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever e-Journal of Surface Science and Nanotechnology 13,pp.102-106 (Collaboration) 2015/03/21
38.	Article	Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy IEICE Transactions on Electronics E98C(2),pp.91-97 (Collaboration) 2015/02/01
39.	Article	Scanning near-field optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever Japanese Journal of Applied Physics 53(12),pp.125201-1-125201-5 (Collaboration) 2014/11/06
40.	Article	Surface potential measurement of fullerene/copper phthalocyanine films on indium tin oxide electrode by Kelvin probe force microscopy Japanese Journal of Applied Physics 53(5),pp.05FY03-1-05FY03-4 (Collaboration) 2014/04/07
41.	Article	Multi-Probe Atomic Force Microscopy Using Piezo-Resistive Cantilevers Interaction between Probes e-Journal of Surface Science and Nanotechnology 11,pp.13-17 (Collaboration) 2013/01/01
42.	Article	Energy Band Diagram near the Interface of Aluminum Oxide on p-Si Fabricated by Atomic Layer Deposition without/with Rapid Thermal Cycle Annealing Determined by Capacitance-Voltage Measurements e-Journal of Surface Science and Nanotechnology 10,pp.22-28 (Collaboration) 2012/03/03
43.	Article	Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[N-(1-naphthyl)-N-phenyl]benzidine Thin Films Fabricated on Indium-Tin Oxide by Kelvin Probe Force Microscopy Japanese Journal of Applied Physics 50(7),pp.071601-1-071601-4 (Collaboration) 2011/07/20
44.	Article	Surface Potential Measurement of Organic Thin Film on Metal Electrodes by Dynamic Force Microscopy Using a Piezoelectric Cantilever Journal of Applied Physics 109(11),pp.114306-1-114306-5 (Collaboration) 2011/06/06
45.	Article	Nanoscale liquid droplet deposition using the ultrasmall aperture on a dynamic mode AFM tip Nanotechnology 22(17),pp.175301-1-175301-5 (Collaboration) 2011/03/16
46.	Article	Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever Applied Physics Letters 96(23),pp.233104-1-233104-3 (Collaboration) 2010/06/07
47.	Article	Local Potential Imaging of a Multilayer Ceramic Capacitor Using Kelvin Probe Force Microscopy Microscopy and Microanalysis 14(S2),pp.960-961 (Collaboration) 2008/08
48.	Article	Development of multi-probe AFM with optical beam deflection method Japanese Journal of Applied Physics 46(8B),pp.5636-5638 (Collaboration) 2007/08/23
49.	Article	Multi-probe atomic force microscopy using piezoelectric cantilevers Japanese Journal of Applied Physics 46(8B),pp.5543-5547 (Collaboration) 2007/08/23
50.	Article	Distribution of Silicon of Bamboo Charcoal by SEM/EDS Bamboo Journal pp.71-80 (Collaboration) 2005/03/31
51.	Article	Investigations of Nanoparticles by Scanning Near-Field Optical Microscopy Combined with Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever Japanese Journal of Applied Physics 43(7B),pp.4651-4654 (Collaboration) 2004/07/01
52.	Article	Nanoscale Investigations of Optical and Electrical Properties by Dynamic mode AFM Using a Piezoelectric cantilever Japanese Journal of Applied Physics 42(7B),pp.4878-4881 (Collaboration) 2003/07/01
53.	Article	Investigations of local surface properties by SNOM combined with KFM using a PZT cantilever IEICE TRANSACTIONS on Electronics E85-C(12),pp.2071-2076 (Collaboration) 2002/12/01
54.	Article	Dynamic-mode AFM using the piezoelectric cantilever: investigations of local optical and electrical properties Applied Surface Science 188(3-4),pp.425-429 (Collaboration) 2002/03/28
55.	Article	Impurity reduction and crystalline quality improvement due to isovalent doping (In) in GaAs epilayers on Si substrate by chemical beam epitaxy J. Crys. Growth 209(4),pp.621-624 (Collaboration) 2000/02/02
56.	Article	Stress reduction and structural quality improvement due to In doping in GaAs/Si Materials Science and Engineering: B 68(3),pp.166-170 (Collaboration) 2000/01/03
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■ Home Page

http://www.orange.it-chiba.ac.jp/