コマノ　ユウイチ   駒野　雄一    所属   千葉工業大学  情報変革科学部 高度応用情報科学科    千葉工業大学  情報科学研究科 情報科学専攻    職種   教授
言語種別	英語
発行・発表の年月	2020/04/01
形態種別	学術雑誌
標題	An IC-level countermeasure against laser fault injection attack by information leakage sensing based on laser-induced opto-electric bulk current density
執筆形態	共著
掲載誌名	Japanese Journal of Applied Physics
掲載区分	国外
出版社・発行元	IOP Publishing
巻・号・頁	59(SG),pp.SGGL02-SGGL02
著者・共著者	Kohei Matsuda,Sho Tada,Makoto Nagata,Yuichi Komano,Yang Li,Takeshi Sugawara,Mitsugu Iwamoto,Kazuo Ohta,Kazuo Sakiyama,Noriyuki Miura
概要	Abstract Laser fault injection (LFI) attacks on cryptographic processor ICs are a critical threat to information systems. This paper proposes an IC-level integrated countermeasure employing an information leakage sensor against an LFI attack. Distributed bulk current sensors monitor abnormal bulk current density caused by laser irradiation for LFI. Time-interleaved sensor operation and sensitivity tuning can obtain partial secret key leakage bit information with small layout area penalty. Based on the leakage information, the secret key can be securely updated to realize high-availability resilient systems. The test chip was designed and fabricated in a 0.18 μm standard CMOS, integrating a 128-bit advanced encryption standard cryptographic processor with the proposed information leakage sensor. This evaluation successfully demonstrated bulk current density and leakage bit monitoring.
PermalinkURL	https://iopscience.iop.org/article/10.7567/1347-4065/ab65d3
researchmap用URL	https://iopscience.iop.org/article/10.7567/1347-4065/ab65d3/pdf