サトウ　ノブオ   Satoh Nobuo   佐藤　宣夫    所属   千葉工業大学  工学部 機械電子創成工学科    千葉工業大学  工学研究科 工学専攻    千葉工業大学  工学研究科 機械電子創成工学専攻    職種   教授
言語種別	英語
発行・発表の年月	2018/07
形態種別	学術雑誌
標題	Nanoscale investigation of bulk heterojunction organic solar cell by scanning capacitance force microscopy
執筆形態	共著
掲載誌名	Japanese Journal of Applied Physics
巻・号・頁	Volume 57(Number 8S1)
著者・共著者	Shota Mochizuki, Nobuo Satoh and Shigetaka Katori
概要	We developed a frequency-modulation atomic force microscopy (FM-AFM) system combined with Kelvin probe force microscopy (KFM) and scanning capacitance force microscopy (SCFM). Using the developed system, we investigated the surface structure and electrical characteristics of a bulk heterojunction (BHJ) sample consisting of a mixture of [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) and poly(3-hexylthiophene) (P3HT). The BHJ structure consisted of PCBM and P3HT molecules. These materials are often used as the active and charge transport layers in an organic solar cell, respectively. The results suggest that we succeeded in visualizing the phase separation in the BHJ sample using SCFM measurements. We illustrated the energy band diagrams from the KFM results and showed that band bending occurs from the organic material side at the interface with the indium-tin oxide substrate. Furthermore, the KFM and SCFM results suggested that charge separation occurs in the BHJ structure.
DOI	10.7567/JJAP.57.08NB05