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サトウ ノブオ
Satoh Nobuo
佐藤 宣夫 所属 千葉工業大学 工学部 機械電子創成工学科 千葉工業大学 工学研究科 工学専攻 千葉工業大学 工学研究科 機械電子創成工学専攻 職種 教授 |
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| 言語種別 | 英語 |
| 発行・発表の年月 | 2011/06 |
| 形態種別 | 学術雑誌 |
| 標題 | Surface Potential Measurement of Organic Thin Film on Metal Electrodes by Dynamic Force Microscopy Using a Piezoelectric Cantilever |
| 執筆形態 | 共著 |
| 掲載誌名 | J. Appl. Phys. |
| 掲載区分 | 国外 |
| 出版社・発行元 | AIP Publishing |
| 巻・号・頁 | 109(11),pp.114306-114310 |
| 著者・共著者 | N. Satoh, S. Katori, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, H. Yamada |
| 概要 | We describe applications of a cantilever with a lead zirconate titanate (PZT) piezoelectric film as self-sensing to dynamic force microscopy (DFM) combined with Kelvin probe force microscopy (KFM). We adopted a frequency modulation (FM) detection method not only to stabilize the imaging conditions in our DFM but also to enhance the sensitivity for the detection of electrostatic forces in KFM measurement. We deposited Alq3 [tris (8-hydroxyquinolinato) aluminum] thin films and aluminum (A1) electrode patterns on an indium tin oxide (ITO)/glass substrate by vacuum evaporation using shadow masks. The surface structures and local surface potential of Alq3 films on metals were investigated using our DFM/KFM instrument to study the local electrical properties at the molecule-metal interface. The photosensitive organic material sample can be in a completely dark environment because no optics are required for cantilever deflection sensing in our experimental setup. |
| DOI | 10.1063/1.3585865 |