サトウ　ノブオ   Satoh Nobuo   佐藤　宣夫    所属   千葉工業大学  工学部 機械電子創成工学科    千葉工業大学  工学研究科 工学専攻    千葉工業大学  工学研究科 機械電子創成工学専攻    職種   教授
言語種別	英語
発行・発表の年月	2015/03
形態種別	学術雑誌
標題	Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever
執筆形態	共著
掲載誌名	e-Journal of Surface Science and Nanotechnology
巻・号・頁	13,pp.102-106
著者・共著者	Nobuo Satoh, Shigetaka Katori, Kei Kobayashi, Shunji Watanabe, Toru Fujii, Kazumi Matsushige, Hirofumi Yamada
概要	Dynamic-mode atomic force microscopy (DFM) combined with Kelvin probe force microscopy (KFM) has been a powerful tool not only for imaging surface topography but also for investigating surface potential on a nanometer-scale resolution. We have developed DFM/KFM using a microfabricated cantilever with a lead zirconate titanate (PZT) piezoelectric thin film used as a deflection sensor. The observed sample can be in a completely dark environment because no optics are required for cantilever deflection sensing in our experimental setup, which is also equipped with a mechanism to irradiate ultraviolet (UV) light onto the sample. We prepared a platinum-on-silicon substrate and deposited fullerene-derivative (PCBM; [6,6]-Phenyl-C61-Butyric Acid Methyl Ester) film patterns by vacuum evaporation with two shadow masks in crossed directions. ...
DOI	10.1380/ejssnt.2015.102