トウ リヨウ
Ryo TOH
陶 良 所属 千葉工業大学 工学部 電気電子工学科 千葉工業大学 工学研究科 工学専攻 千葉工業大学 工学研究科 電気電子工学専攻 職種 教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2023/11 |
形態種別 | 学術雑誌 |
標題 | Terahertz wave imaging using time domain iterative shrink threshold method |
執筆形態 | 共著 |
掲載誌名 | Japanese Journal of Applied Physics |
掲載区分 | 国外 |
出版社・発行元 | The Japan Society of Applied Physics |
巻・号・頁 | 62,pp.112001-112001 |
総ページ数 | 7 |
担当区分 | 責任著者 |
著者・共著者 | Tatsuya Kaneoya, Ryo Toh, and Koji Suizu |
概要 | We propose a new linear imaging method that combines the iterative shrinkage thresholding algorithm (ISTA) with the synthetic aperture (SA) method to achieve high resolution. Unlike other ISTA methods that use a single frequency component of signals, we use time domain signals directly as measurement, which allows for simultaneous wide bandwidth calculation and potentially better imaging results. Additionally, we simplify the backward estimation process by using impulse back-projection based on the SA method, which reduces the computing cost compared to the ISTA method. Numerical simulation and experimental measurement results show that the image resolution is similar to that of our previous nonlinear imaging method, and two reflectors with different reflectivity are imaged linearly. These comparison results demonstrate the effectiveness of
our proposed method in achieving high-resolution and maintaining the linearity of target reflectivity. |