クマタニ　アキチカ   Akichika Kumatani   熊谷　明哉    所属   千葉工業大学  工学部 電気電子工学科    千葉工業大学  工学研究科 工学専攻    職種   教授
言語種別	英語
発行・発表の年月	2017/06/06
形態種別	学術雑誌
査読	査読あり
標題	High Speed Scanning Ion Conductance Microscopy for Quantitative Analysis of Nanoscale Dynamics of Microvilli
執筆形態	共著
掲載誌名	Analytical Chemistry
掲載区分	国外
出版社・発行元	AMER CHEMICAL SOC
巻・号・頁	89(11),pp.6015-6020
著者・共著者	Hiroki Ida,Yasufumi Takahashi,Akichika Kumatani,Hitoshi Shiku,Tomokazu Matsue
概要	Observation of nanoscale structure dynamics on cell surfaces is essential to understanding cell functions. Hopping-mode scanning ion conductance microscopy (SICM) was used to visualize the topography of fragile convoluted nanoscale structures on cell surfaces under noninvasive conditions. However, conventional hopping mode SICM does not have sufficient temporal resolution to observe cell-surface dynamics in situ because of the additional time required for performing vertical probe movements of the nanopipette. Here, we introduce a new scanning algorithm for high speed SICM measurements using low capacitance and high-resonance-frequency piezo stages. As a result, a topographic image is taken within 18 s with a 64 × 64 pixel resolution at 10 × 10 μm. The high speed SICM is applied to the characterization of microvilli dynamics on surfaces, which shows clear structural changes after the epidermal growth factor stimulation.
DOI	10.1021/acs.analchem.7b00584
ISSN	0003-2700/1520-6882
PMID	28481079