サトウ　ノブオ   Satoh Nobuo   佐藤　宣夫    所属   千葉工業大学  工学部 宇宙・半導体工学科    千葉工業大学  工学研究科 工学専攻    千葉工業大学  工学研究科 機械電子創成工学専攻    職種   教授
言語種別	英語
発行・発表の年月	2011/07/20
形態種別	学術雑誌
標題	Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[N-(1-naphthyl)-N-phenyl]benzidine Thin Films Fabricated on Indium-Tin Oxide by Kelvin Probe Force Microscopy
執筆形態	共著
掲載誌名	Japanese Journal of Applied Physics
出版社・発行元	The Japan Society of Applied Physics
巻・号・頁	50(7),pp.071601-1-071601-4
著者・共著者	S. Katori, N. Satoh, M. Yahiro, K. Kobayashi, H. Yamada, K. Matsushige, and S. Fujita
概要	To clarify the interfacial properties of an organic light-emitting diode (OLED), we discuss the surface potential of organic semiconductor thin films fabricated on an electrode that was measured by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KFM) utilizing frequency modulation (FM). The organic semiconductor films were deposited on a glass/indium-tin-oxide (ITO) substrate by the vacuum evaporation technique using intersecting metal shadow masks. This deposition technique enables us to fabricate four different areas on the same substrate. The surface potentials of the crossover area of the deposited thin films were investigated by the nc-AFM/KFM technique. The energy band diagram was depicted, and we observed that the charge behavior of the organic semiconductor depended on the material and the structure.
DOI	10.1143/JJAP.50.071601
PermalinkURL	https://iopscience.iop.org/article/10.1143/JJAP.50.071601