サトウ　ノブオ   Satoh Nobuo   佐藤　宣夫    所属   千葉工業大学  工学部 宇宙・半導体工学科    千葉工業大学  工学研究科 工学専攻    千葉工業大学  工学研究科 機械電子創成工学専攻    職種   教授
言語種別	英語
発行・発表の年月	2017/07
形態種別	学術雑誌
標題	Surface potential measurement of n-type organic semiconductor thin films by mist deposition via Kelvin probe microscopy
執筆形態	共著
掲載誌名	Japanese Journal of Applied Physics
巻・号・頁	Volume 56(Number 8S1)
著者・共著者	Akihiro Odaka, Nobuo Satoh and Shigetaka Katori
概要	We partially deposited fullerene (C60) and phenyl-C61-butyric acid methyl ester thin films that are typical n-type semiconductor materials on indium-tin oxide by mist deposition at various substrate temperatures. The topographic and surface potential images were observed via dynamic force microscopy/Kelvin probe force microscopy with the frequency modulation detection method. We proved that the area where a thin film is deposited depends on the substrate temperature during deposition from the topographic images. It was also found that the surface potential depends on the substrate temperature from the surface potential images.
DOI	10.7567/JJAP.56.08LB04