クマタニ アキチカ
Akichika Kumatani
熊谷 明哉 所属 千葉工業大学 工学部 電気電子工学科 千葉工業大学 工学研究科 工学専攻 職種 教授 |
|
言語種別 | 英語 |
発行・発表の年月 | 2012/01 |
形態種別 | 学術雑誌 |
標題 | Reduction of charge injection barrier by 1-nm contact oxide interlayer in organic field effect transistors |
執筆形態 | 共著 |
掲載誌名 | Applied Physics Letters |
掲載区分 | 国外 |
出版社・発行元 | American Institute of Physics |
巻・号・頁 | 100(1) |
著者・共著者 | Peter Darmawan,Takeo Minari,Akichika Kumatani,Yun Li,Chuan Liu,Kazuhito Tsukagoshi |
概要 | The enhancement of the charge injection process by the insertion of an ultrathin (similar to 1 nm) contact oxide interlayer (COI) at the metal/organic material interface in organic field effect transistors (OFETs) is reported. Six different oxides were used as COI, and Al(2)O(3) was found to exhibit the highest OFET mobility with a reduction in the average contact resistance (R(c)) from 19.9 to 1.9 k Omega.cm. Photoelectron yield spectroscopy analysis revealed that the insertion of COI increases the work function of an Au contact and reduces the charge injection barrier at the interface, which lowers R(c) and, therefore, results in enhanced device performance. (C) 2012 American Institute of Physics. [doi:10.1063/1.3673842] |
DOI | 10.1063/1.3673842 |
ISSN | 0003-6951/1077-3118 |
PermalinkURL | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84862907467&origin=inward |