サトウ　ノブオ   Satoh Nobuo   佐藤　宣夫    所属   千葉工業大学  工学部 宇宙・半導体工学科    千葉工業大学  工学研究科 工学専攻    千葉工業大学  工学研究科 機械電子創成工学専攻    職種   教授
言語種別	英語
発行・発表の年月	2011/06/06
形態種別	学術雑誌
標題	Surface Potential Measurement of Organic Thin Film on Metal Electrodes by Dynamic Force Microscopy Using a Piezoelectric Cantilever
執筆形態	共著
掲載誌名	Journal of Applied Physics
掲載区分	国外
出版社・発行元	AIP Publishing
巻・号・頁	109(11),pp.114306-1-114306-5
担当区分	筆頭著者
著者・共著者	N. Satoh, S. Katori, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, H. Yamada
概要	We describe applications of a cantilever with a lead zirconate titanate (PZT) piezoelectric film as self-sensing to dynamic force microscopy (DFM) combined with Kelvin probe force microscopy (KFM). We adopted a frequency modulation (FM) detection method not only to stabilize the imaging conditions in our DFM but also to enhance the sensitivity for the detection of electrostatic forces in KFM measurement. We deposited Alq3 [tris (8-hydroxyquinolinato) aluminum] thin films and aluminum (A1) electrode patterns on an indium tin oxide (ITO)/glass substrate by vacuum evaporation using shadow masks. The surface structures and local surface potential of Alq3 films on metals were investigated using our DFM/KFM instrument to study the local electrical properties at the molecule-metal interface. The photosensitive organic material sample can be in a completely dark environment because no optics are required for cantilever deflection sensing in our experimental setup.
DOI	10.1063/1.3585865
PermalinkURL	https://pubs.aip.org/aip/jap/article-abstract/109/11/114306/697434/Surface-potential-measurement-of-organic-thin-film?redirectedFrom=fulltext