サトウ　ノブオ   Satoh Nobuo   佐藤　宣夫    所属   千葉工業大学  工学部 宇宙・半導体工学科    千葉工業大学  工学研究科 工学専攻    千葉工業大学  工学研究科 機械電子創成工学専攻    職種   教授
言語種別	英語
発行・発表の年月	2017/04
形態種別	学術雑誌
標題	Non-resonant frequency components observed in a dynamic Atomic Force Microscope
執筆形態	共著
掲載誌名	IEICE Nonlinear Theory and Its Applications
掲載区分	国内
巻・号・頁	8(2),pp.118-128
著者・共著者	Hokuto Nagao, Takeshi Uruma, Kuniyasu Shimizu, Nobuo Satoh, Koji Suizu
概要	The oscillating behavior of a micro-cantilever probe plays a central role in the atomic force microscope for studying a nanoscale sample. The oscillatory phenomena in the microscope are numerically investigated by exciting the probe with a single frequency. We observe the non-resonant frequency components, which correspond to a frequency of transient beats superimposed on the stable solution, around the natural frequency of the probe, when the probe is close to the sample. The difference between the non-resonant frequency and the natural frequency changes when the tip-sample distance decreases. Furthermore, we investigate the originating point of the non-resonant frequency components as a function of the tip-sample distance. In addition, we perform an actual experiment for observing the frequency components near the resonant frequency.
DOI	http://doi.org/10.1587/nolta.8.118