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サトウ ノブオ
Satoh Nobuo
佐藤 宣夫 所属 千葉工業大学 工学部 宇宙・半導体工学科 千葉工業大学 工学研究科 工学専攻 千葉工業大学 工学研究科 機械電子創成工学専攻 職種 教授 |
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| 言語種別 | 英語 |
| 発行・発表の年月 | 2015/03/21 |
| 形態種別 | 学術雑誌 |
| 査読 | 査読あり |
| 標題 | Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever |
| 執筆形態 | 共著 |
| 掲載誌名 | e-Journal of Surface Science and Nanotechnology |
| 掲載区分 | 国外 |
| 巻・号・頁 | 13,pp.102-106 |
| 著者・共著者 | N. Satoh, S. Katori, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige, H. Yamada |
| 概要 | Dynamic-mode atomic force microscopy (DFM) combined with Kelvin probe force microscopy (KFM) has been a powerful tool not only for imaging surface topography but also for investigating surface potential on a nanometer-scale resolution. We have developed DFM/KFM using a microfabricated cantilever with a lead zirconate titanate (PZT) piezoelectric thin film used as a deflection sensor. The observed sample can be in a completely dark environment because no optics are required for cantilever deflection sensing in our experimental setup, which is also equipped with a mechanism to irradiate ultraviolet (UV) light onto the sample. We prepared a platinum-on-silicon substrate and deposited fullerene-derivative (PCBM; [6,6]-Phenyl-C61-Butyric Acid Methyl Ester) film patterns by vacuum evaporation with two shadow masks in crossed directions. ... |
| DOI | 10.1380/ejssnt.2015.102 |
| PermalinkURL | https://www.jstage.jst.go.jp/article/ejssnt/13/0/13_102/_article |