サトウ ノブオ   Satoh Nobuo
  佐藤 宣夫
   所属   千葉工業大学  工学部 宇宙・半導体工学科
   千葉工業大学  工学研究科 工学専攻
   千葉工業大学  工学研究科 機械電子創成工学専攻
   職種   教授
言語種別 英語
発行・発表の年月 2015/02/01
形態種別 学術雑誌
標題 Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy
執筆形態 共著
掲載誌名 IEICE Transactions on Electronics
掲載区分国外
巻・号・頁 E98C(2),pp.91-97
担当区分 筆頭著者,責任著者
著者・共著者 N. Satoh, S. Katori, K. Kobayashi, K. Matsushige, H. Yamada
概要 We have investigated both the film thickness and surface potential of organic semiconductors deposited on two kinds of electrodes by the simultaneous observation with the dynamic force microscopy (DFM)/Kelvin-probe force microscope (KFM). To clarify the interfacial properties of organic semiconductor, we fabricated samples that imitated the organic light emitting diode (OLED) structure by depositing bis [N, N'-(1-naphthyl)-N,N'-phenyl] benzidine (alpha-NPD) and tris (8-hydroxyquinolinato) aluminum (Alq3), respectively, on indium-tin-oxide (ITO) as anode and aluminum (Al) as cathode by the vacuum evaporation deposition using intersecting metal shadow masks. This deposition technique enables us to fabricate four different areas in the same substrate. ...
DOI 10.1587/transele.E98.C.91
PermalinkURL https://www.jstage.jst.go.jp/article/transele/E98.C/2/E98.C_91/_article