サトウ　ノブオ   Satoh Nobuo   佐藤　宣夫    所属   千葉工業大学  工学部 宇宙・半導体工学科    千葉工業大学  工学研究科 工学専攻    千葉工業大学  工学研究科 機械電子創成工学専攻    職種   教授
言語種別	英語
発行・発表の年月	2014/04/07
形態種別	学術雑誌
標題	Surface potential measurement of fullerene/copper phthalocyanine films on indium tin oxide electrode by Kelvin probe force microscopy
執筆形態	共著
掲載誌名	Japanese Journal of Applied Physics
掲載区分	国外
出版社・発行元	The Japan Society of Applied Physics
巻・号・頁	53(5),pp.05FY03-1-05FY03-4
担当区分	筆頭著者,責任著者
著者・共著者	N. Satoh, S. Katori, K. Kobayashi, K. Matsushige, H. Yamada
概要	Various organic semiconductor thin films were deposited on an indium tin oxide (ITO) electrode/glass substrate to simulate organic solar cells. The electrical properties at the organic/inorganic and organic/organic interfaces were evaluated by dynamic-mode atomic force microscopy (DFM) together with Kelvin probe force microscopy (KFM). By employing the frequency modulation (FM) method, the DFM/KFM system allows for not only consistent imaging over a wide scanning area, but also highly sensitive detection of the surface potential. The charge carrier behavior at the interface was clarified by simultaneously obtaining topographic and surface potential images of the same area using DFM/KFM and depicting the energy band diagram with band bending in the fullerene (C60) film.
DOI	10.7567/JJAP.53.05FY03
ISSN	0021-4922
PermalinkURL	https://iopscience.iop.org/article/10.7567/JJAP.53.05FY03/meta