サトウ　ノブオ   Satoh Nobuo   佐藤　宣夫    所属   千葉工業大学  工学部 宇宙・半導体工学科    千葉工業大学  工学研究科 工学専攻    千葉工業大学  工学研究科 機械電子創成工学専攻    職種   教授
言語種別	英語
発行・発表の年月	2004/07/01
形態種別	学術雑誌
標題	Investigations of Nanoparticles by Scanning Near-Field Optical Microscopy Combined with Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever
執筆形態	共著
掲載誌名	Japanese Journal of Applied Physics
掲載区分	国外
出版社・発行元	The Japan Society of Applied Physics
巻・号・頁	43(7B),pp.4651-4654
著者・共著者	N. Satoh, K. Kobayashi, S. Watanabe, T. Fujii, H. Yamada, K. Matsushige
概要	A microfabricated cantilever with a lead zirconate titanate (PZT) piezoelectric thin film used as ail integrated deflection sensor was applied to dynamic-mode atomic force microscopy (AFM). This probe can be used for scanning near-field optical microscopy (SNOM) and Kelvin-probe force microscopy (KFM). We adopted a frequency modulation (FM) detection method not only to stabilize imaging conditions in dynamic-mode AFM but also to enhance sensitivity for the detection of electrostatic forces in KFM measurement. We investigated local optical and electrical properties of gold and polystyrene nanoparticles dispersed on an indium tin oxide (ITO) substrate. We Successfully identified the species of each particle by different contrasts obtained in SNOM and KFM images.
DOI	10.1143/JJAP.43.4651
PermalinkURL	https://iopscience.iop.org/article/10.1143/JJAP.43.4651